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| L4978D资料 | |
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L4978D PDF Download |
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File Size : 105 KB
Manufacturer:ST Description: 4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified. Separate samples may be used for each step. In the event of a group B failure, the manufacturer may pull a new sample at double size from either the failed assembly lot or from another assembly lot from the same wafer lot. If the new assembly lot option is exercised, the failed assembly lot shall be scrapped. Electrical measurements (end-points) shall be in accordance with table I, subgroup 2 herein. |
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| 1PCS | 100PCS | 1K | 10K | ||
| 价 格 | |||||
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型 号：L4978D 厂 家：ST 封 装：05+ 批 号：787 数 量： 说 明： |
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运 费： 所在地： 新旧程度： |
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| 联系人：张小姐、 颜先生13661569158 |
| 电 话：400-878-9158,021-54286636 |
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| QQ：12230627,596815151,531081618 |
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